Tesla Instruments - Pvt. Limited

X-ray fluorescence energy dispersive general purpose spectrometer

Energy Dispersive X-Ray Fluorescence Spectrometer is able to detect simultaneously about 20 chemical elements less than 200 sec over a wide concentration range from hundreds of ppb. This Analytical Instrument is able to analyze solid, liquid and powder samples, as well as materials on the surface or deposits on the filters.

The vacuum measurement chamber and ultrathin input window of detector provides high analytical characteristics in range of light elements from 9F to 17Cl.

High-performance silicon drift detector (SDD) with low energy resolution (less 135eV) is able to define spectral lines almost all elements, that allows the analysis of complex multicomponent substances (high alloy steels, precision alloys, polymetallic ores, etc.).

Quartz Crystal Microbalance

The measuring principle is based on impedance analysis of the quartz crystal. The resonant frequency and the bandwidth of the resonant conductance curve are determined. The bandwidth or full width at half maximum, (FWHM) is a direct correlation with the quality factor (Q) which is by definition the inverse of dissipation (D).